Lee HJ - Search Results

1

Measurement of Exciton and Trion Energies in Multistacked hBN/WS₂ Coupled Quantum Wells for Resonant Tunneling Diodes.

Lee MJ, Seo DH, Kwon SM, Kim D, Kim Y, Yun WS, Cha JH, Song HK, Lee S, Jung M, Lee HJ, Kim JS, Heo JS, Seo S, Park SK. Lee MJ, et al. Among authors: lee s, lee hj. ACS Nano. 2020 Nov 24;14(11):16114-16121. doi: 10.1021/acsnano.0c08133. Epub 2020 Nov 3. ACS Nano. 2020. PMID: 33140970 Free article.

2

Impact of transient currents caused by alternating drain stress in oxide semiconductors.

Lee HJ, Cho SH, Abe K, Lee MJ, Jung M. Lee HJ, et al. Among authors: lee mj. Sci Rep. 2017 Aug 29;7(1):9782. doi: 10.1038/s41598-017-10285-2. Sci Rep. 2017. PMID: 28852104 Free PMC article.

3

Electron-blocking by the potential barrier originated from the asymmetrical local density of state in the oxide semiconductor.

Lee HJ, Abe K, Kim JS, Lee MJ. Lee HJ, et al. Among authors: lee mj. Sci Rep. 2017 Dec 21;7(1):17963. doi: 10.1038/s41598-017-18420-9. Sci Rep. 2017. PMID: 29269745 Free PMC article.

4

Reliable Multivalued Conductance States in TaO _x Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis.

Lee MJ, Park GS, Seo DH, Kwon SM, Lee HJ, Kim JS, Jung M, You CY, Lee H, Kim HG, Pang SB, Seo S, Hwang H, Park SK. Lee MJ, et al. Among authors: lee h, lee hj. ACS Appl Mater Interfaces. 2018 Sep 5;10(35):29757-29765. doi: 10.1021/acsami.8b09046. Epub 2018 Aug 2. ACS Appl Mater Interfaces. 2018. PMID: 30033726 Free article.

5

Analysis of the hump phenomenon and needle defect states formed by driving stress in the oxide semiconductor.

Lee HJ, Abe K, Noh HY, Kim JS, Lee H, Lee MJ. Lee HJ, et al. Among authors: lee h, lee mj. Sci Rep. 2019 Aug 19;9(1):11977. doi: 10.1038/s41598-019-48552-z. Sci Rep. 2019. PMID: 31427668 Free PMC article.

6

Non-equilibrium chiral domain wall dynamics excited by transverse magnetic field pulses.

Cho J, Kim KW, Lee MJ, Lee HJ, Kim JS. Cho J, et al. Among authors: lee mj, lee hj. J Phys Condens Matter. 2021 Jan 6;33(1):015803. doi: 10.1088/1361-648X/abb64f. J Phys Condens Matter. 2021. PMID: 33052891

7

Parasitic Current Induced by Gate Overlap in Thin-Film Transistors.

Lee HJ, Abe K, Kim JS, Yun WS, Lee MJ. Lee HJ, et al. Among authors: lee mj. Materials (Basel). 2021 Apr 29;14(9):2299. doi: 10.3390/ma14092299. Materials (Basel). 2021. PMID: 33946711 Free PMC article.

8

Thermoelectric performance of novel single-layer ZrTeSe₄.

Yun WS, Lee HJ, Kim JS, Lee MJ, Han SW. Yun WS, et al. Among authors: lee mj, lee hj. Phys Chem Chem Phys. 2022 Nov 30;24(46):28250-28256. doi: 10.1039/d2cp03092f. Phys Chem Chem Phys. 2022. PMID: 36382534

9

Hydrogen diffusion and its electrical properties variation as a function of the IGZO stacking structure.

Noh HY, Lee WG, G R H, Cha JH, Kim JS, Yun WS, Lee MJ, Lee HJ. Noh HY, et al. Among authors: lee mj, lee wg, lee hj. Sci Rep. 2022 Nov 17;12(1):19816. doi: 10.1038/s41598-022-24212-7. Sci Rep. 2022. PMID: 36396967 Free PMC article.

10

Interface roughness effects and relaxation dynamics of an amorphous semiconductor oxide-based analog resistance switching memory.

Haripriya GR, Noh HY, Lee CK, Kim JS, Lee MJ, Lee HJ. Haripriya GR, et al. Among authors: lee ck, lee mj, lee hj. Nanoscale. 2023 Sep 14;15(35):14476-14487. doi: 10.1039/d3nr02591h. Nanoscale. 2023. PMID: 37605886

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