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Addressing the High-Voltage Structural and Electrochemical Instability of Ni-Containing Layered Transition Metal (TM) Oxide Cathodes by "Blocking" the "TM-Migration" Pathway in the Lattice.
Sharma A, Rajkamal A, Kobi S, Kumar BS, Paidi AK, Chatterjee A, Mukhopadhyay A. Sharma A, et al. Among authors: rajkamal a. ACS Appl Mater Interfaces. 2021 Jun 9;13(22):25836-25849. doi: 10.1021/acsami.1c01347. Epub 2021 May 24. ACS Appl Mater Interfaces. 2021. PMID: 34028254