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An ultralow-noise superconducting radio-frequency ion trap for frequency metrology with highly charged ions.
Stark J, Warnecke C, Bogen S, Chen S, Dijck EA, Kühn S, Rosner MK, Graf A, Nauta J, Oelmann JH, Schmöger L, Schwarz M, Liebert D, Spieß LJ, King SA, Leopold T, Micke P, Schmidt PO, Pfeifer T, Crespo López-Urrutia JR. Stark J, et al. Among authors: pfeifer t. Rev Sci Instrum. 2021 Aug 1;92(8):083203. doi: 10.1063/5.0046569. Rev Sci Instrum. 2021. PMID: 34470420
The Heidelberg compact electron beam ion traps.
Micke P, Kühn S, Buchauer L, Harries JR, Bücking TM, Blaum K, Cieluch A, Egl A, Hollain D, Kraemer S, Pfeifer T, Schmidt PO, Schüssler RX, Schweiger C, Stöhlker T, Sturm S, Wolf RN, Bernitt S, Crespo López-Urrutia JR. Micke P, et al. Among authors: pfeifer t. Rev Sci Instrum. 2018 Jun;89(6):063109. doi: 10.1063/1.5026961. Rev Sci Instrum. 2018. PMID: 29960545
Electronic Bridge Excitation in Highly Charged ^{229}Th Ions.
Bilous PV, Bekker H, Berengut JC, Seiferle B, von der Wense L, Thirolf PG, Pfeifer T, López-Urrutia JRC, Pálffy A. Bilous PV, et al. Among authors: pfeifer t. Phys Rev Lett. 2020 May 15;124(19):192502. doi: 10.1103/PhysRevLett.124.192502. Phys Rev Lett. 2020. PMID: 32469560
High Resolution Photoexcitation Measurements Exacerbate the Long-Standing Fe XVII Oscillator Strength Problem.
Kühn S, Shah C, López-Urrutia JRC, Fujii K, Steinbrügge R, Stierhof J, Togawa M, Harman Z, Oreshkina NS, Cheung C, Kozlov MG, Porsev SG, Safronova MS, Berengut JC, Rosner M, Bissinger M, Ballhausen R, Hell N, Park S, Chung M, Hoesch M, Seltmann J, Surzhykov AS, Yerokhin VA, Wilms J, Porter FS, Stöhlker T, Keitel CH, Pfeifer T, Brown GV, Leutenegger MA, Bernitt S. Kühn S, et al. Among authors: pfeifer t. Phys Rev Lett. 2020 Jun 5;124(22):225001. doi: 10.1103/PhysRevLett.124.225001. Phys Rev Lett. 2020. PMID: 32567918
260 results