Nievergelt AP - Search Results

1

Time-Resolved Scanning Ion Conductance Microscopy for Three-Dimensional Tracking of Nanoscale Cell Surface Dynamics.

Leitao SM, Drake B, Pinjusic K, Pierrat X, Navikas V, Nievergelt AP, Brillard C, Djekic D, Radenovic A, Persat A, Constam DB, Anders J, Fantner GE. Leitao SM, et al. Among authors: nievergelt ap. ACS Nano. 2021 Nov 23;15(11):17613-17622. doi: 10.1021/acsnano.1c05202. Epub 2021 Nov 9. ACS Nano. 2021. PMID: 34751034 Free PMC article.

2

High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers.

Adams JD, Nievergelt A, Erickson BW, Yang C, Dukic M, Fantner GE. Adams JD, et al. Rev Sci Instrum. 2014 Sep;85(9):093702. doi: 10.1063/1.4895460. Rev Sci Instrum. 2014. PMID: 25273731

3

High-frequency multimodal atomic force microscopy.

Nievergelt AP, Adams JD, Odermatt PD, Fantner GE. Nievergelt AP, et al. Beilstein J Nanotechnol. 2014 Dec 22;5:2459-67. doi: 10.3762/bjnano.5.255. eCollection 2014. Beilstein J Nanotechnol. 2014. PMID: 25671141 Free PMC article.

4

High-Resolution Correlative Microscopy: Bridging the Gap between Single Molecule Localization Microscopy and Atomic Force Microscopy.

Odermatt PD, Shivanandan A, Deschout H, Jankele R, Nievergelt AP, Feletti L, Davidson MW, Radenovic A, Fantner GE. Odermatt PD, et al. Among authors: nievergelt ap. Nano Lett. 2015 Aug 12;15(8):4896-904. doi: 10.1021/acs.nanolett.5b00572. Epub 2015 Jul 6. Nano Lett. 2015. PMID: 26121585 Free article.

5

Studying biological membranes with extended range high-speed atomic force microscopy.

Nievergelt AP, Erickson BW, Hosseini N, Adams JD, Fantner GE. Nievergelt AP, et al. Sci Rep. 2015 Jul 14;5:11987. doi: 10.1038/srep11987. Sci Rep. 2015. PMID: 26169348 Free PMC article.

6

Harnessing the damping properties of materials for high-speed atomic force microscopy.

Adams JD, Erickson BW, Grossenbacher J, Brugger J, Nievergelt A, Fantner GE. Adams JD, et al. Nat Nanotechnol. 2016 Feb;11(2):147-51. doi: 10.1038/nnano.2015.254. Epub 2015 Nov 23. Nat Nanotechnol. 2016. PMID: 26595334

7

A monolithic MEMS position sensor for closed-loop high-speed atomic force microscopy.

Hosseini N, Nievergelt AP, Adams JD, Stavrov VT, Fantner GE. Hosseini N, et al. Among authors: nievergelt ap. Nanotechnology. 2016 Apr 1;27(13):135705. doi: 10.1088/0957-4484/27/13/135705. Epub 2016 Feb 19. Nanotechnology. 2016. PMID: 26894523

8

Corrigendum: Studying biological membranes with extended range high-speed atomic force microscopy.

Nievergelt AP, Erickson BW, Hosseini N, Adams JD, Fantner GE. Nievergelt AP, et al. Sci Rep. 2016 Mar 10;6:21654. doi: 10.1038/srep21654. Sci Rep. 2016. PMID: 26961854 Free PMC article. No abstract available.

9

Division site selection linked to inherited cell surface wave troughs in mycobacteria.

Eskandarian HA, Odermatt PD, Ven JXY, Hannebelle MTM, Nievergelt AP, Dhar N, McKinney JD, Fantner GE. Eskandarian HA, et al. Among authors: nievergelt ap. Nat Microbiol. 2017 Jun 26;2:17094. doi: 10.1038/nmicrobiol.2017.94. Nat Microbiol. 2017. PMID: 28650475

10

Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy.

Dukic M, Todorov V, Andany S, Nievergelt AP, Yang C, Hosseini N, Fantner GE. Dukic M, et al. Among authors: nievergelt ap. Rev Sci Instrum. 2017 Dec;88(12):123712. doi: 10.1063/1.5010181. Rev Sci Instrum. 2017. PMID: 29289234

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