Cook RF - Search Results

1

Microscale Mapping of Structure and Stress in Barium Titanate.

Howell JA, Vaudin MD, Friedman LH, Cook RF. Howell JA, et al. Among authors: cook rf. J Res Natl Inst Stand Technol. 2020 Apr 4;125:125013. doi: 10.6028/jres.125.013. eCollection 2020. J Res Natl Inst Stand Technol. 2020. PMID: 35465393 Free PMC article.

2

Contact-resonance atomic force microscopy for nanoscale elastic property measurements: Spectroscopy and imaging.

Stan G, Krylyuk S, Davydov AV, Vaudin MD, Bendersky LA, Cook RF. Stan G, et al. Among authors: cook rf. Ultramicroscopy. 2009 Jul;109(8):929-36. doi: 10.1016/j.ultramic.2009.03.025. Epub 2009 Mar 25. Ultramicroscopy. 2009. PMID: 19361926

3

High resolution surface morphology measurements using EBSD cross-correlation techniques and AFM.

Vaudin MD, Stan G, Gerbig YB, Cook RF. Vaudin MD, et al. Among authors: cook rf. Ultramicroscopy. 2011 Jul;111(8):1206-13. doi: 10.1016/j.ultramic.2011.01.039. Epub 2011 Feb 3. Ultramicroscopy. 2011. PMID: 21763237

4

Prototype cantilevers for quantitative lateral force microscopy.

Reitsma MG, Gates RS, Friedman LH, Cook RF. Reitsma MG, et al. Among authors: cook rf. Rev Sci Instrum. 2011 Sep;82(9):093706. doi: 10.1063/1.3624700. Rev Sci Instrum. 2011. PMID: 21974593

5

Designing a standard for strain mapping: HR-EBSD analysis of SiGe thin film structures on Si.

Vaudin MD, Osborn WA, Friedman LH, Gorham JM, Vartanian V, Cook RF. Vaudin MD, et al. Among authors: cook rf. Ultramicroscopy. 2015 Jan;148:94-104. doi: 10.1016/j.ultramic.2014.09.007. Epub 2014 Sep 30. Ultramicroscopy. 2015. PMID: 25461586

6

Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented Si.

Friedman LH, Vaudin MD, Stranick SJ, Stan G, Gerbig YB, Osborn W, Cook RF. Friedman LH, et al. Among authors: cook rf. Ultramicroscopy. 2016 Apr;163:75-86. doi: 10.1016/j.ultramic.2016.02.001. Epub 2016 Feb 17. Ultramicroscopy. 2016. PMID: 26939030 Free PMC article.

7

Near-theoretical fracture strengths in native and oxidized silicon nanowires.

DelRio FW, White RM, Krylyuk S, Davydov AV, Friedman LH, Cook RF. DelRio FW, et al. Among authors: cook rf. Nanotechnology. 2016 Aug 5;27(31):31LT02. doi: 10.1088/0957-4484/27/31/31LT02. Epub 2016 Jun 21. Nanotechnology. 2016. PMID: 27325151

8

Stochastic behavior of nanoscale dielectric wall buckling.

Friedman LH, Levin I, Cook RF. Friedman LH, et al. Among authors: cook rf. J Appl Phys. 2016 Mar;119(11):114305. doi: 10.1063/1.4943615. Epub 2016 Mar 16. J Appl Phys. 2016. PMID: 27330220 Free PMC article.

9

Review: Coefficients for Stress, Temperature, and Composition Effects in Fluorescence Measurements of Alumina.

Cook RF, Michaels CA. Cook RF, et al. J Res Natl Inst Stand Technol. 2017 Dec 13;122:1-26. doi: 10.6028/jres.122.043. eCollection 2017. J Res Natl Inst Stand Technol. 2017. PMID: 34877102 Free PMC article.

10

Stress Measurements in Alumina by Optical Fluorescence: Revisited.

Cook RF, Michaels CA. Cook RF, et al. J Res Natl Inst Stand Technol. 2019 Aug 27;124:1-15. doi: 10.6028/jres.124.020. eCollection 2019. J Res Natl Inst Stand Technol. 2019. PMID: 34877176 Free PMC article.

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