Robust unfolding of MeV x-ray spectra from filter stack spectrometer data.
Wong CS, Strehlow J, Broughton DP, Luedtke SV, Huang CK, Bogale A, Fitzgarrald R, Nedbailo R, Schmidt JL, Schmidt TR, Twardowski J, Van Pelt A, Alvarez MA, Junghans A, Mix LT, Reinovsky RE, Rusby DR, Wang Z, Wolfe B, Albright BJ, Batha SH, Palaniyappan S.
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Rev Sci Instrum. 2024 Feb 1;95(2):023301. doi: 10.1063/5.0190679.
Rev Sci Instrum. 2024.
PMID: 38341719