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An ultra high-endurance memristor using back-end-of-line amorphous SiC.
Kapur O, Guo D, Reynolds J, Newbrook D, Han Y, Beanland R, Jiang L, de Groot CHK, Huang R. Kapur O, et al. Among authors: de groot chk. Sci Rep. 2024 Jun 18;14(1):14008. doi: 10.1038/s41598-024-64499-2. Sci Rep. 2024. PMID: 38890324 Free PMC article.
Toward a Procedure for the Template Free Growth of Te Nanowires Across an Insulator by Electrodeposition.
Black AW, Abdelazim NM, Noori YJ, Han Y, Zhelev N, Thomas S, Zhang W, Reid G, Beanland R, de Groot CHK, Bartlett PN. Black AW, et al. Among authors: de groot chk. J Phys Chem C Nanomater Interfaces. 2024 Oct 22;128(43):18634-18640. doi: 10.1021/acs.jpcc.4c05915. eCollection 2024 Oct 31. J Phys Chem C Nanomater Interfaces. 2024. PMID: 39502806 Free PMC article.
Phase-Change Memory Properties of Electrodeposited Ge-Sb-Te Thin Film.
Huang R, Kissling GP, Jolleys A, Bartlett PN, Hector AL, Levason W, Reid G, De Groot CH. Huang R, et al. Among authors: de groot ch. Nanoscale Res Lett. 2015 Dec;10(1):432. doi: 10.1186/s11671-015-1136-4. Epub 2015 Nov 2. Nanoscale Res Lett. 2015. PMID: 26525703 Free PMC article.
39 results