X-ray reflectivity and diffuse-scattering study of CoSi2 layers in Si produced by ion-beam synthesis
Phys Rev B Condens Matter
.
1993 Feb 15;47(8):4385-4393.
doi: 10.1103/physrevb.47.4385.
Authors
D Bahr
,
W Press
,
R Jebasinski
,
S Mantl
PMID:
10006586
DOI:
10.1103/physrevb.47.4385
No abstract available