E1 and E2/E0 form factors and strength distributions from 28Si (e,e'p) and 28Si (e,e' alpha ) coincidence scattering
Phys Rev Lett
.
1986 Jun 30;56(26):2789-2792.
doi: 10.1103/PhysRevLett.56.2789.
Authors
T Kihm
,
KT Knöpfle
,
H Riedesel
,
P Voruganti
,
HJ Emrich
,
G Fricke
,
R Neuhausen
,
RK Schneider
PMID:
10033095
DOI:
10.1103/PhysRevLett.56.2789
No abstract available