Measuring properties of point defects by electron microscopy: The Ga vacancy in GaAs
Phys Rev Lett
.
1992 May 4;68(18):2798-2801.
doi: 10.1103/PhysRevLett.68.2798.
Authors
JL Rouviere
,
Y Kim
,
J Cunningham
,
JA Rentschler
,
A Bourret
,
A Ourmazd
PMID:
10045495
DOI:
10.1103/PhysRevLett.68.2798
No abstract available