High-pressure x-ray diffraction of SiO2 glass
Phys Rev Lett
.
1992 Aug 31;69(9):1387-1390.
doi: 10.1103/PhysRevLett.69.1387.
Authors
C Meade
,
RJ Hemley
,
HK Mao
PMID:
10047204
DOI:
10.1103/PhysRevLett.69.1387
No abstract available