First experiments using a new energy-filtering microscope (Sub-eV-Sub-A microscope, or SESAM) are shown. They make use of the high transmissivity of the 90 degree filter. This allows the mapping of chemical bonding of large specimen areas, even if narrow energy selecting slits are used. Because large scattering angles are accepted by this filter, energy-filtered diffraction patterns extending to 150 mrad can be recorded by a single exposure. This can be used to determine the reduced density function of amorphous materials and reduces the exposure time of the investigated area by three orders of magnitude as compared with previous approaches.