Gradient chemical micro patterns: a reference substrate for surface nanometrology

Duangrut Julthongpiput; Michael J Fasolka; Wenhua Zhang; Tinh Nguyen; Eric J Amis

doi:10.1021/nl050612n

Gradient chemical micro patterns: a reference substrate for surface nanometrology

Nano Lett. 2005 Aug;5(8):1535-40. doi: 10.1021/nl050612n.

Authors

Duangrut Julthongpiput¹, Michael J Fasolka, Wenhua Zhang, Tinh Nguyen, Eric J Amis

Affiliation

¹ Polymers Division and Materials and Construction Research Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.

PMID: 16089484
DOI: 10.1021/nl050612n

Abstract

We present fabrication routes for a new type of surface specimen that exhibits a micro pattern with a gradient in chemical contrast between the pattern domains. Design elements in the specimen allow chemical contrast in the micro pattern to be related to well-established surface characterization data, such as contact angle measurements. These gradient specimens represent a reference tool for calibrating image contrast in chemically sensitive scanning probe microscopy techniques and a platform for the high-throughput analysis of polymer thin film behavior.

Publication types

Research Support, N.I.H., Extramural
Research Support, U.S. Gov't, P.H.S.

MeSH terms

Materials Testing / methods*
Materials Testing / standards*
Microscopy, Scanning Probe / methods*
Microscopy, Scanning Probe / standards*
Nanostructures / analysis*
Nanostructures / chemistry
Nanostructures / standards
Nanotechnology / methods*
Nanotechnology / standards*
Reference Standards
Surface Properties