Fabrication of crossed junctions of semiconducting and metallic carbon nanotubes: a CNT-gated CNT-FET

J Nanosci Nanotechnol. 2006 May;6(5):1325-30. doi: 10.1166/jnn.2006.321.

Abstract

We have developed a method to fabricate crossed junctions between semiconducting (s) and metallic (m) carbon nanotubes (CNTs) combining electric field directed chemical vapor deposition growth and dielectrophoretic alignment. By separating the s- and m-CNTs with a thin dielectric an ultra-small field effect transistor (FET) was fabricated. By using the m-CNT as a gate it was possible to modulate the source-drain current through the s-CNT FET channel. We have also used the m-CNT as an electrical lead. An off-state current lowering was observed when the m-CNT lead was used as a drain electrode.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Crystallization / methods*
  • Electric Impedance
  • Equipment Design
  • Equipment Failure Analysis
  • Materials Testing
  • Microelectrodes*
  • Nanotechnology / instrumentation*
  • Nanotechnology / methods
  • Nanotubes, Carbon / analysis
  • Nanotubes, Carbon / chemistry*
  • Nanotubes, Carbon / ultrastructure*
  • Semiconductors
  • Transistors, Electronic*

Substances

  • Nanotubes, Carbon