Abstract
We performed four-terminal conductivity measurements on a CoSi2 nanowire (NW) at room temperature by using PtIr-coated carbon nanotube (CNT) tips in a four-tip scanning tunneling microscope. The physical stability and high aspect ratio of the CNT tips made it possible to reduce the probe spacing down to ca. 30 nm. The probe-spacing dependence of resistance showed diffusive transport even at 30 nm and no current leakage to the Si substrate.
Publication types
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Evaluation Study
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Research Support, Non-U.S. Gov't
MeSH terms
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Electric Impedance
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Electrochemistry / instrumentation*
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Electrochemistry / methods
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Equipment Design
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Equipment Failure Analysis / instrumentation*
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Equipment Failure Analysis / methods
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Iridium / chemistry*
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Materials Testing / instrumentation*
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Materials Testing / methods
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Microelectrodes*
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Nanotubes, Carbon / chemistry*
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Nanotubes, Carbon / ultrastructure
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Platinum / chemistry*
Substances
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Nanotubes, Carbon
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Iridium
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Platinum