Evidence for an elongated (>60 ion skin depths) electron diffusion region during fast magnetic reconnection

Phys Rev Lett. 2007 Dec 21;99(25):255002. doi: 10.1103/PhysRevLett.99.255002. Epub 2007 Dec 21.

Abstract

Observations of an extremely elongated electron diffusion region occurring during fast reconnection are presented. Cluster spacecraft in situ observations of an expanding reconnection exhaust reveal a broad current layer ( approximately 10 ion skin depths thick) supporting the reversal of the reconnecting magnetic field together with an intense current embedded at the center that is due to a super-Alfvénic electron outflow jet with transverse scale of approximately 9 electron skin depths. The electron jet extends at least 60 ion skin depths downstream from the X-line.