A new sample holder for laser-excited pump-probe magnetic measurements on a Focus photoelectron emission microscope

Rev Sci Instrum. 2008 Mar;79(3):033702. doi: 10.1063/1.2884709.

Abstract

A custom-made Omicron-compatible sample holder for time-resolved photoelectron emission microscopy experiments is presented. It comprises a sample plate with four contacts that hosts a chip carrier where the semiconductor substrate is mounted. Covering the sample holder, a 6 mm diameter mask protects electrostatically the sample from the extractor lens voltage while keeping the imaging quality unperturbed. The improvements are a greater sample lifetime and the ability to withstand much higher currents in the stripline that provides the magnetic pulse to the magnetic microstructure.