Edge enhancement for in-phase focal modulation microscope

Ke Si; Wei Gong; Nanguang Chen; Colin J R Sheppard

doi:10.1364/AO.48.006290

Edge enhancement for in-phase focal modulation microscope

Appl Opt. 2009 Nov 10;48(32):6290-5. doi: 10.1364/AO.48.006290.

Authors

Ke Si¹, Wei Gong, Nanguang Chen, Colin J R Sheppard

Affiliation

¹ Graduate School for Integrative Sciences and Engineering, National University of Singapore, 10 Medical Drive, Singapore 117597, Singapore.

PMID: 19904330
DOI: 10.1364/AO.48.006290

Abstract

In-phase focal modulation microscopy (IPFMM) with single photon excited fluorescence is presented. Optical transfer functions and images of thin and thick fluorescent edges in IPFMM are investigated. The results show that, compared with confocal microscopy, using IPFMM can result in a sharper image of the edge, and the edge gradient can be increased up to 75.4% and 58.9% for a thick edge and a thin edge, respectively. Signal level is also discussed, and the results show that, to obtain high transverse resolution with IPFMM, the normalized detector pinhole radius should not exceed 2.8.

Publication types

Evaluation Study

MeSH terms

Computer-Aided Design
Equipment Design
Equipment Failure Analysis
Image Enhancement / instrumentation*
Microscopy, Fluorescence / instrumentation*
Microscopy, Phase-Contrast / instrumentation*
Reproducibility of Results
Sensitivity and Specificity