Probing exciton localization in single-walled carbon nanotubes using high-resolution near-field microscopy

ACS Nano. 2010 Oct 26;4(10):5914-20. doi: 10.1021/nn101443d.

Abstract

We observe localization of excitons in semiconducting single-walled carbon nanotubes at room temperature using high-resolution near-field photoluminescence (PL) microscopy. Localization is the result of spatially confined exciton energy minima with depths of more than 15 meV connected to lateral energy gradients exceeding 2 meV/nm as evidenced by energy-resolved PL imaging. Simulations of exciton diffusion in the presence of energy variations support this interpretation predicting strongly enhanced PL at local energy minima.

Publication types

  • Research Support, Non-U.S. Gov't
  • Research Support, U.S. Gov't, Non-P.H.S.

MeSH terms

  • Computer Simulation
  • DNA / chemistry
  • Diffusion
  • Light
  • Microscopy / methods*
  • Microscopy, Confocal / methods
  • Models, Theoretical
  • Nanotechnology / methods*
  • Nanotubes / chemistry
  • Nanotubes, Carbon / chemistry*
  • Photochemistry / methods
  • Semiconductors

Substances

  • Nanotubes, Carbon
  • DNA