Note: Vector reflectometry in a beam waveguide

J R Eimer; C L Bennett; D T Chuss; E J Wollack

doi:10.1063/1.3622522

Note: Vector reflectometry in a beam waveguide

Rev Sci Instrum. 2011 Aug;82(8):086101. doi: 10.1063/1.3622522.

Authors

J R Eimer¹, C L Bennett, D T Chuss, E J Wollack

Affiliation

¹ Department of Physics and Astronomy, The Johns Hopkins University, Baltimore, Maryland 21218, USA. [email protected]

PMID: 21895279
DOI: 10.1063/1.3622522

Abstract

We present a one-port calibration technique for characterization of beam waveguide components with a vector network analyzer. This technique involves using a set of known delays to separate the responses of the instrument and the device under test. We demonstrate this technique by measuring the reflected performance of a millimeter-wave variable-delay polarization modulator.