Diffused reflectance and structure analysis for the nano-matrix (ZnO(1-x)SiO2(x)) system

Optical and structural properties of the investigated matrix ZnO(1-x)SiO2(x) system were characterized by various techniques such as X-ray analysis and UV-VIS-NIR absorption. The structural changes of the studied nano-matrix ZnO(1-x)SiO2(x) with the concentration of nanosilica are checked by X-ray analysis measurement. The crystal structures for ZnO, (ZnO)0.75(SiO2)0.25, (ZnO)0.50(SiO2)0.50 and (ZnO)0.25(SiO2)0.75 and pure SiO2 are hexagonal, monoclinic, tetragonal, orthorhombic and amorphous respectively and detailed crystal parameters are obtained. The electronic properties of ZnO(1-x)SiO2(x) are investigated, where the optical band gaps for the five studied systems are 3.22eV, 3.24eV, 3.27eV, 3.30eV and 4.5eV respectively. It is clear that the band gap increases with increasing SiO2 content. Mixing the ZnO with SiO2 enhance the UV response of these materials which is confirmed by diffused reflectance spectrum used to analyze the UV response of the studied systems.