We demonstrate a trade-off between linewidth and loss-of-lock rate in a mode-locked laser employing active feedback to control the carrier-envelope offset phase difference. In frequency metrology applications, the linewidth translates directly to uncertainty in the measured frequency, whereas the impact of lock loss and recovery on the measured frequency is less well understood. We reduce the dynamics to stochastic differential equations, specifically diffusion processes, and compare the linearized linewidth to the rate of lock loss determined by the mean time to exit, as calculated from large deviation theory.