Improved shielding for energy-dispersive X-ray microanalysis in the high-voltage electron microscope
J Electron Microsc Tech
.
1989 Nov;13(3):274-6.
doi: 10.1002/jemt.1060130316.
Author
W F Tivol
1
Affiliation
1
Wadsworth Ctr. for Labs., Albany, NY 12201-0509.
PMID:
2585127
DOI:
10.1002/jemt.1060130316
No abstract available
Publication types
Research Support, U.S. Gov't, P.H.S.
MeSH terms
Animals
Beryllium
Equipment Design
Eukaryota / ultrastructure
Manganese
Microscopy, Electron / methods*
Radiation Protection*
Substances
Manganese
Beryllium
Grants and funding
RR01219/RR/NCRR NIH HHS/United States
RR02984/RR/NCRR NIH HHS/United States