Thinness-controlled perovskite wafers are directly prepared using a geometry-regulated dynamic-flow reaction system. It is found that the wafers are a superior material for photodetectors with a photocurrent response ≈350 times higher than that made of microcrystalline thin films. Moreover, the wafers are compatible with mass production of integrated circuits.
Keywords: controlled growth; perovskites; photodetectors; ultrathin; wafers.
© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.