Custom sample environments at the ALBA XPEEM

Michael Foerster; Jordi Prat; Valenti Massana; Nahikari Gonzalez; Abel Fontsere; Bernat Molas; Oscar Matilla; Eric Pellegrin; Lucia Aballe

doi:10.1016/j.ultramic.2016.08.016

Custom sample environments at the ALBA XPEEM

Ultramicroscopy. 2016 Dec:171:63-69. doi: 10.1016/j.ultramic.2016.08.016. Epub 2016 Aug 30.

Authors

Michael Foerster¹, Jordi Prat², Valenti Massana², Nahikari Gonzalez², Abel Fontsere², Bernat Molas², Oscar Matilla², Eric Pellegrin², Lucia Aballe²

Affiliations

¹ ALBA Synchrotron Light Facility, Carrer de la Llum 2-26, Cerdanyola del Vallés, 08290 Barcelona, Spain. Electronic address: [email protected].
² ALBA Synchrotron Light Facility, Carrer de la Llum 2-26, Cerdanyola del Vallés, 08290 Barcelona, Spain.

PMID: 27620135
DOI: 10.1016/j.ultramic.2016.08.016

Abstract

A variety of custom-built sample holders offer users a wide range of non-standard measurements at the ALBA synchrotron PhotoEmission Electron Microscope (PEEM) experimental station. Some of the salient features are: an ultrahigh vacuum (UHV) suitcase compatible with many offline deposition and characterization systems, built-in electromagnets for uni- or biaxial in-plane (IP) and out-of-plane (OOP) fields, as well as the combination of magnetic fields with electric fields or current injection. Electronics providing a synchronized sinusoidal signal for sample excitation enable time-resolved measurements at the 500MHz storage ring RF frequency.

Keywords: (X)PEEM; Electric contacts; In-situ electromagnet; Quadrupole; Sample environment; UHV suitcase.

Publication types

Research Support, Non-U.S. Gov't