Topochemical Analysis of Cell Wall Components by TOF-SIMS

Methods Mol Biol. 2017:1544:249-256. doi: 10.1007/978-1-4939-6722-3_18.

Abstract

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a recently developing analytical tool and a type of imaging mass spectrometry. TOF-SIMS provides mass spectral information with a lateral resolution on the order of submicrons, with widespread applicability. Sometimes, it is described as a surface analysis method without the requirement for sample pretreatment; however, several points need to be taken into account for the complete utilization of the capabilities of TOF-SIMS. In this chapter, we introduce methods for TOF-SIMS sample treatments, as well as basic knowledge of wood samples TOF-SIMS spectral and image data analysis.

Keywords: Cellulose; Chemical mapping; Extractives; Inorganic metals; Lignin; TOF-SIMS.

MeSH terms

  • Cell Wall / chemistry*
  • Cellulose / analysis
  • Lignin / analysis
  • Phytochemicals / analysis*
  • Spectrometry, Mass, Secondary Ion* / methods
  • Wood / chemistry

Substances

  • Phytochemicals
  • Cellulose
  • Lignin