Author Correction: Orientational Mapping Augmented Sub-Wavelength Hyper-Spectral Imaging of Silk

Affiliations

• ¹ Tokyo Institute of Technology, Meguro-ku, Tokyo, 152-8550, Japan.
• ² Nanotechnology facility, Center for Micro-Photonics, Swinburne University of Technology, John st., Hawthorn, Victoria, 3122, Australia.
• ³ Department of Laser Technologies, Center for Physical Sciences and Technology, Savanoriu Ave. 231, LT-02300, Vilnius, Lithuania.
• ⁴ Infrared Microspectroscopy Beamline, Australian Synchrotron, Clayton, Victoria, 3168, Australia.
• ⁵ Department of Chemical Engineering, Graduate School of Engineering, Kyoto University, Nishikyo-ku, Kyoto, 615-8510, Japan.
• ⁶ Institute for Frontier Materials, Deakin University, Waurn Ponds, Victoria, 3217, Australia.
• ⁷ Nanotechnology facility, Center for Micro-Photonics, Swinburne University of Technology, John st., Hawthorn, Victoria, 3122, Australia. [email protected].
• ⁸ Center of Nanotechnology, King Abdulaziz University, Jeddah, 21589, Saudi Arabia. [email protected].
• ⁹ Melbourne Center for Nanofabrication, Australian National Fabrication Facility, Clayton, 3168, Australia. [email protected].
• ¹⁰ Tokyo Institute of Technology, Meguro-ku, Tokyo, 152-8550, Japan. [email protected].