Towards quantitative mapping of the charge distribution along a nanowire by in-line electron holography

Shikai Liu; Te Shi; Qiongyang Chen; Amin Zhai; He Tian; ZeJun Ding; JiXue Li; Ze Zhang

doi:10.1016/j.ultramic.2018.08.006

Towards quantitative mapping of the charge distribution along a nanowire by in-line electron holography

Ultramicroscopy. 2018 Nov:194:126-132. doi: 10.1016/j.ultramic.2018.08.006. Epub 2018 Aug 9.

Authors

Shikai Liu¹, Te Shi², Qiongyang Chen¹, Amin Zhai¹, He Tian³, ZeJun Ding², JiXue Li⁴, Ze Zhang⁴

Affiliations

¹ Center of Electron Microscope, School of Material Science & Engineering, Zhejiang University, Hangzhou 310027, China.
² Key Laboratory of Strongly-Coupled Quantum Matter Physics, Chinese Academy of Sciences; Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, Hefei, Anhui, 230026, PR China.
³ Center of Electron Microscope, School of Material Science & Engineering, Zhejiang University, Hangzhou 310027, China; State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, China. Electronic address: [email protected].
⁴ Center of Electron Microscope, School of Material Science & Engineering, Zhejiang University, Hangzhou 310027, China; State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, China.

PMID: 30125753
DOI: 10.1016/j.ultramic.2018.08.006

Abstract

Mapping the charge distribution in nano scale systems still is a difficult task, but is important to provide fundamental insights into the properties of materials. We demonstrate how in-line holography in transmission electron microscopy can be used to extract the charge distribution in the nanowire in a quantitative way. This technique can realize a fast acquisition of delicate charge variations. By taking advantage of the possibilities of in-situ electron microscopy, variations of the external field can be used to modulate the charge distribution. Because of the fast response to charge variations, this method provides an efficient probing tool for detecting dynamic charge redistribution.

Keywords: Charge distribution mapping; In-line holography; Transmission electron microscopy.

Publication types

Research Support, Non-U.S. Gov't