Correction to Weakly Trapped, Charged, and Free Excitons in Single-Layer MoS
2
in the Presence of Defects, Strain, and Charged Impurities
ACS Nano
.
2018 Oct 23;12(10):10565-10566.
doi: 10.1021/acsnano.8b07086.
Epub 2018 Sep 20.
Authors
Sudipta Dubey
,
Simone Lisi
,
Goutham Nayak
,
Felix Herziger
,
Van-Dung Nguyen
,
Toai Le Quang
,
Vladimir Cherkez
,
César González
,
Yannick J Dappe
,
Kenji Watanabe
,
Takashi Taniguchi
,
Laurence Magaud
,
Pierre Mallet
,
Jean-Yves Veuillen
,
Raul Arenal
,
Laëtitia Marty
,
Julien Renard
,
Nedjma Bendiab
,
Johann Coraux
,
Vincent Bouchiat
PMID:
30234967
DOI:
10.1021/acsnano.8b07086
No abstract available
Publication types
Published Erratum