Design for a 10 keV multi-pass transmission electron microscope

Stewart A Koppell; Marian Mankos; Adam J Bowman; Yonatan Israel; Thomas Juffmann; Brannon B Klopfer; Mark A Kasevich

doi:10.1016/j.ultramic.2019.112834

Design for a 10 keV multi-pass transmission electron microscope

Ultramicroscopy. 2019 Dec:207:112834. doi: 10.1016/j.ultramic.2019.112834. Epub 2019 Aug 30.

Authors

Stewart A Koppell¹, Marian Mankos², Adam J Bowman³, Yonatan Israel³, Thomas Juffmann⁴, Brannon B Klopfer³, Mark A Kasevich³

Affiliations

¹ Physics Department, Stanford University, 382 Via Pueblo Mall, Stanford, CA 94305, USA. Electronic address: [email protected].
² Electron Optica, 1000 Elwell Court #110 Palo Alto, California 94303, USA.
³ Physics Department, Stanford University, 382 Via Pueblo Mall, Stanford, CA 94305, USA.
⁴ Faculty of Physics, University of Vienna, Vienna A-1090, Austria; Department of Structural and Computational Biology, Max F. Perutz Laboratories, University of Vienna, Vienna A-1030, Austria.

PMID: 31520925
DOI: 10.1016/j.ultramic.2019.112834

Abstract

Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections needed to create a 3D model and would allow the imaging of lower-contrast, more heterogeneous samples. We have designed a 10 keV proof-of-concept MPTEM. The column features fast-switching gated electron mirrors which cause each electron to interrogate the sample multiple times. A linear approximation for the multi-pass contrast transfer function (CTF) is developed to explain how the resolution depends on the number of passes through the sample.

Publication types

Research Support, Non-U.S. Gov't
Research Support, U.S. Gov't, Non-P.H.S.