Proliferation of Faulty Materials Data Analysis in the Literature
Microsc Microanal
.
2020 Feb;26(1):1-2.
doi: 10.1017/S1431927619015332.
Authors
Matthew R Linford
1
,
Vincent S Smentkowski
2
,
John T Grant
3
,
C Richard Brundle
4
,
Peter M A Sherwood
5
,
Mark C Biesinger
6
,
Jeff Terry
7
,
Kateryna Artyushkova
8
,
Alberto Herrera-Gómez
9
,
Sven Tougaard
10
,
William Skinner
11
,
Jean-Jacques Pireaux
12
,
Christopher F McConville
13
,
Christopher D Easton
14
,
Thomas R Gengenbach
14
,
George H Major
1
,
Paul Dietrich
15
,
Andreas Thissen
15
,
Mark Engelhard
16
,
Cedric J Powell
17
,
Karen J Gaskell
18
,
Donald R Baer
16
Affiliations
1
Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT84602, USA.
2
General Electric Research, Niskayuna, NY12309, USA.
3
Surface Analysis Consultant, Clearwater, FL33767, USA.
4
C.R. Brundle & Associates, Soquel, CA95073, USA.
5
University of Washington, Box 351700, Seattle, WA98195, USA.
6
Surface Science Western, University of Western Ontario, London, OntarioN6G 0J3, Canada.
7
Department of Physics, Illinois Institute of Technology, Chicago, IL60616, USA.
8
Physical Electronics, Chanhassen, MN55317, USA.
9
CINVESTAV - Unidad Queretaro, Real de Juriquilla76230, Mexico.
10
Department of Physics, University of Southern Denmark, Odense5230, Denmark.
11
Future Industries Institute, University of South Australia, Mawson Lakes, SA 5095, Australia.
12
University of Namur, Namur Institute of Structured Matter, B-5000Namur, Belgium.
13
College of Science, RMIT University, Melbourne, VIC3001, Australia.
14
CSIRO Manufacturing, Ian Wark Laboratories, Clayton, VIC3168, Australia.
15
SPECS Surface Nano Analysis GmbH, 13355Berlin, Germany.
16
Pacific Northwest National Laboratory, Richland, WA99354, USA.
17
National Institute of Standards and Technology, Gaithersburg, MD20899, USA.
18
University of Maryland, College Park, MD20742, USA.
PMID:
31948499
DOI:
10.1017/S1431927619015332
No abstract available