Peak Force Infrared-Kelvin Probe Force Microscopy

Angew Chem Int Ed Engl. 2020 Sep 7;59(37):16083-16090. doi: 10.1002/anie.202004211. Epub 2020 Jun 25.

Abstract

Correlative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provide insight into the structure-function relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a challenge. We seamlessly integrated nanoscale photothermal infrared imaging with Coulomb force detection to form peak force infrared-Kelvin probe force microscopy (PFIR-KPFM), which enables simultaneous nanomapping of infrared absorption, surface potential, and mechanical properties with approximately 10 nm spatial resolution in a single-pass scan. MAPbBr3 perovskite crystals of different degradation pathways were studied in situ. Nanoscale charge accumulations were observed in MAPbBr3 near the boundary to PbBr2 . PFIR-KPFM also revealed correlations between residual charges and secondary conformation in amyloid fibrils. PFIR-KPFM is applicable to other heterogeneous materials at the nanoscale for correlative multimodal characterizations.

Keywords: IR spectroscopy; amyloid fibrils; perovskites; scanning probe microscopy; surface potential.

Publication types

  • Research Support, Non-U.S. Gov't