Feasibility study of interferometric phase-contrast X-ray imaging using the hard-X-ray free-electron laser of the SPring-8 Angstrom Compact Free-Electron Laser

Akio Yoneyama; Rika Baba; Daiko Takamatsu; Chika Kamezawa; Ichiro Inoue; Taito Osaka; Shigeki Owada; Makina Yabashi

doi:10.1107/S1600577520007778

Feasibility study of interferometric phase-contrast X-ray imaging using the hard-X-ray free-electron laser of the SPring-8 Angstrom Compact Free-Electron Laser

J Synchrotron Radiat. 2020 Sep 1;27(Pt 5):1358-1361. doi: 10.1107/S1600577520007778. Epub 2020 Jul 10.

Authors

Akio Yoneyama¹, Rika Baba¹, Daiko Takamatsu¹, Chika Kamezawa², Ichiro Inoue³, Taito Osaka³, Shigeki Owada⁴, Makina Yabashi³

Affiliations

¹ Research and Development Group, Hitachi Ltd., 1-280 Higashi-koigakubo, Kokubunji, Tokyo 185-8601, Japan.
² Department of Materials Structure Science, The Graduate University for Advanced Studies, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan.
³ RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan.
⁴ Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.

PMID: 32876611
DOI: 10.1107/S1600577520007778

Abstract

Aiming for the fine observation of fast physical phenomena such as phonon propagation and laser ablation, phase-contrast X-ray imaging combined with a crystal X-ray interferometer and the X-ray free-electron laser (XFEL) of the SPring-8 Angstrom Compact Free-Electron Laser has been developed. An interference pattern with 70% visibility was obtained by single-shot exposure with a 15 keV monochromated XFEL. In addition, a phase map of an acrylic wedge was successfully obtained using the fringe scanning method.

Keywords: X-ray free-electron lasers; crystal X-ray interferometers; phase maps; phase-contrast X-ray imaging.