Structural, magnetic and dielectric properties in 3 d-5 d based Sr₂FeIrO₆thin films

The structural, magnetic and dielectric properties have been investigated in 3d-5dbased double perovskite Sr₂FeIrO₆thin films deposited by pulse laser deposition technique. To understand the effect of strain, epitaxial films are grown with varying thickness as well as on different substrates i.e., SrTiO₃(100) and LaAlO₃(100). The films with highest thickness are found to be more relaxed. Atomic force microscope images indicate all films are of good quality where grain sizes increase with increase in film thickness. X-ray absorption (XAS) spectroscopy measurements indicate a Ir⁵⁺charge state in present films while providing a detailed picture of hybridization between Fe/Ir-dand O-porbitals. The bulk antiferromagnetic transition is retained in films though the transition temperature shifts to higher temperature. Both dielectric constant (ϵ_r) and loss (tan δ) show change around the magnetic ordering temperatures of bulk Sr₂FeIrO₆indicating a close relation between dielectric and magnetic behaviors. A Maxwell-Wagner type relaxation is found to follow over whole frequency range down to low temperature in present film. On changing the substrate i.e., LaAlO₃(100), theϵ_r(T) and (tan δ(T)) show almost similar behavior butϵ_rshows a higher value which is due to an increased strain coming from high mismatch of lattice parameters.