Characterization of the Percival detector with soft X-rays

J Synchrotron Radiat. 2021 Jan 1;28(Pt 1):131-145. doi: 10.1107/S1600577520013958. Epub 2021 Jan 1.

Abstract

In this paper the back-side-illuminated Percival 2-Megapixel (P2M) detector is presented, along with its characterization by means of optical and X-ray photons. For the first time, the response of the system to soft X-rays (250 eV to 1 keV) is presented. The main performance parameters of the first detector are measured, assessing the capabilities in terms of noise, dynamic range and single-photon discrimination capability. Present limitations and coming improvements are discussed.

Keywords: CMOS Imager; Percival; detector; photon science; soft X-rays.