Author Correction: Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy

Affiliations

• ¹ School of Physics, Ultrafast Electron Microscopy Laboratory, Nankai University, Tianjin, 300071, China. [email protected].
• ² Condensed Matter Physics and Material Science Department, Brookhaven National Laboratory, Upton, NY, 11973, USA. [email protected].
• ³ Institute of Physics, Laboratory for Ultrafast Microscopy and Electron Scattering (LUMES), École Polytechnique Fédérale de Lausanne, Station 6, Lausanne, 1015, Switzerland.
• ⁴ Department of Quantum Matter Physics, University of Geneva, 24 Quai Ernest-Ansermet, 1211, Geneva 4, Switzerland.
• ⁵ Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA.
• ⁶ Department of Materials Science, University of Milano-Bicocca, Via Cozzi 55, 20121, Milano, Italy.
• ⁷ Institute of Physics, Laboratory for Ultrafast Microscopy and Electron Scattering (LUMES), École Polytechnique Fédérale de Lausanne, Station 6, Lausanne, 1015, Switzerland. [email protected].
• ⁸ Condensed Matter Physics and Material Science Department, Brookhaven National Laboratory, Upton, NY, 11973, USA. [email protected].