In this paper we report the crystal growth conditions and optical anisotropy properties of Tungsten ditelluride (WTe2) single crystals. The chemical vapor transport (CVT) method was used for the synthesis of large WTe2 crystals with high crystallinity and surface quality. These were structurally and morphologically characterized by means of X-ray diffraction, optical profilometry and Raman spectroscopy. Through spectroscopic ellipsometry analysis, based on the Tauc-Lorentz model, we identified a high refractive index value (~4) and distinct tri-axial anisotropic behavior of the optical constants, which opens prospects for surface plasmon activity, revealed by the dielectric function. The anisotropic physical nature of WTe2 shows practical potential for low-loss light modulation at the 2D nanoscale level.
Keywords: Raman spectroscopy; WTe2; XRD; chemical vapor transport; spectroscopic ellipsometry.