Single-shot experiments at the soft X-FEL FERMI using a back-side-illuminated scientific CMOS detector. Corrigendum

J Synchrotron Radiat. 2022 Mar 1;29(Pt 2):594. doi: 10.1107/S1600577522001370. Epub 2022 Feb 15.

Abstract

The name of one of the authors in the article by Léveillé et al. [(2022), J. Synchrotron Rad. 29, 103-110] is corrected.

Keywords: CMOS; single-shot experiment; soft X-ray FEL applications; time resolved.

Publication types

  • Published Erratum