In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy. Corrigendum

J Synchrotron Radiat. 2024 Sep 1;31(Pt 5):1409-1413. doi: 10.1107/S1600577524006283. Epub 2024 Aug 6.

Abstract

Errors in variable subscripts, equations and Fig. 8 in Section 3.2 of the article by Lotze et al. [(2024). J. Synchrotron Rad. 31, 42-52] are corrected.

Keywords: in situ deformation; nanodiffraction; nanoindentation; sample environment; stress mapping.

Publication types

  • Published Erratum