Author Correction: Improved oxidation behavior of Hf0.11Al0.20B0.69 in comparison to Hf0.28B0.72 magnetron sputtered thin films

Sci Rep. 2024 Oct 24;14(1):25223. doi: 10.1038/s41598-024-75854-8.
No abstract available

Publication types

  • Published Erratum