Large-Area Metal-Organic Framework Glasses for Efficient X-Ray Detection

Adv Mater. 2024 Dec;36(51):e2412432. doi: 10.1002/adma.202412432. Epub 2024 Nov 17.

Abstract

Cutting-edge techniques utilizing continuous films made from pure, novel semiconductive materials offer promising pathways to achieve high performance and cost-effectiveness for X-ray detection. Semiconductive metal-organic framework (MOF) glass films are known for their remarkably smooth surface morphology, straightforward synthesis, and capability for large-area fabrication, presenting a new direction for high-performance X-ray detectors. Here, a novel material centered on MOF glasses for highly uniform glass film fabrication customized for X-ray detection is introduced. MOF glasses, composed of zinc and imidazole derivatives, enable the transition from solid to liquid at low temperatures, facilitating the straightforward preparation of large-area and continuous MOF films with high mobility for X-ray device fabrication. Remarkably, MOF glass detectors demonstrate an exceptional sensitivity of 112.8 µC Gyair -1 cm-2 and a detection limit of 0.41 µGyair s-1, making them one of the most sensitive and with the best detection limits reported to date for MOF X-ray detectors. Clear X-ray images are successfully conducted using these developed MOF glass detectors for the first time. This breakthrough in X-ray sensitivity, and detection limit along with the spatial imaging resolution establishes a new standard for developing large-area and efficient MOF-based X-ray detectors with practical applications in medical and security screening.

Keywords: X‐ray detection; large‐area film; metal–organic framework glasses; semiconductor MOF.