Artefacts and diagnostic pitfalls in contrast-enhanced mammography: a pictorial review

Y T Wong; S Yang; P W Leong; D L Y Chow; K Y Kwok; K Y K Lau; O C A Li

doi:10.1016/j.crad.2024.106763

Artefacts and diagnostic pitfalls in contrast-enhanced mammography: a pictorial review

Clin Radiol. 2024 Nov 30:81:106763. doi: 10.1016/j.crad.2024.106763. Online ahead of print.

Authors

Y T Wong¹, S Yang², P W Leong², D L Y Chow², K Y Kwok², K Y K Lau², O C A Li²

Affiliations

¹ Department of Radiology and Nuclear Medicine, Tuen Mun Hospital, 23 Tsing Chung Koon Road, Tuen Mun, N.T, Hong Kong; Department of Radiology, Pok Oi Hospital, Au Tau, Yuen Long, N.T., Hong Kong. Electronic address: [email protected].
² Department of Radiology and Nuclear Medicine, Tuen Mun Hospital, 23 Tsing Chung Koon Road, Tuen Mun, N.T, Hong Kong; Department of Radiology, Pok Oi Hospital, Au Tau, Yuen Long, N.T., Hong Kong.

PMID: 39740293
DOI: 10.1016/j.crad.2024.106763

Abstract

Contrast-enhanced mammography (CEM) is an advanced emerging imaging technique that uses iodine contrast medium to improve breast cancer detection. Understanding CEM artefacts and pitfalls is important to prevent diagnostic misinterpretation. This article aims to provide a comprehensive review of the artefacts and potential diagnostic pitfalls encountered in CEM, focusing on their characteristic imaging features and strategies to mitigate these issues.

Publication types

Review