Integrating time-of-flight (ToF) measurements in radiography and computed tomography (CT) enables an approach for scatter rejection in imaging systems that eliminates the need for anti-scatter grids, potentially increasing system sensitivity and image quality. However, present hardware dedicated to the time-correlated measurement of X-rays is limited to a small scale and low density. A switch to highly integrated electronics and detectors is needed to progress towards a medium-scale system capable of acquiring images, while offering a timing resolution below 300 ps FWHM to achieve scatter rejection comparable to current grids. 
Approach. Using off-the-shelf photodetectors and readouts designed for ToF positron emission tomography (PET) provides a preliminary evaluation of available high-density systems in the context of ToF scatter rejection. The TOFPET2c ASIC from PETSys showed good potential, offering an established development platform necessary for fast and reliable results, with no known limitation regarding time-correlated detection of medical imaging X-rays (20 keV to 140 keV).
Main results. Reliable photon detection down to 31 keV was achieved, reaching energy resolutions from 23% to 92% FWHM throughout the desired energy range. Optimal detector timing resolution (DTR) from 250 ps FWHM at 130 keV to 678 ps FWHM at 30 keV was reached. Strong time walk effects were observed, showing a time shift of 642 ps up to 1740 ps between events spanning the energies used in X-ray medical imaging.
Significance. The TOFPET2c ASIC has shown its potential for ToF scatter rejection, but meets the time resolution requirement of 300 ps FWHM only for limited energies (110 keV to 140 keV). This significant timing degradation observed at lower energies limits the use of the TOFPET2c ASIC for ToF scatter rejection, but offers significant advancements regarding the understanding of the phenomenon arising from the time-correlated detection of X-rays for medical imaging.
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Keywords: Computed tomography; Medical imaging; Radiography; Scatter rejection; SiPM; Time-of-Flight; Time-resolved electronics.
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