Analysis of electroporation-induced genetic damages in V79/AP4 Chinese hamster cells

Mutat Res. 1993 Jun;291(3):163-9. doi: 10.1016/0165-1161(93)90156-t.

Abstract

Electroporation is a recent technique used to introduce exogenous DNA into eukaryotic cells. It is important to establish that the gene of interest is transferred into a functional, non-mutated recipient cell. V79/AP4 Chinese hamster cells were exposed to high-voltage pulsed electric fields and some biological and genetic effects were measured. The results showed that cytotoxicity was related in a dose-dependent manner to the number of applied pulses. Thioguanine-resistant colony-forming cells as well as chromosomal aberrations were also induced whereas ouabain resistants and sister-chromatid exchanges were not or slightly induced. Spontaneous and electroporation-induced clones that were phenotypically TGR/HATS were used to investigate the hprt locus. Molecular screening of the locus showed that the number of deleted exons was significantly higher in induced than in spontaneous TG-resistant clones, suggesting that the genetic damages induced by electroporation concern the loss of regions well over the size of the hprt locus.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Animals
  • Cell Survival
  • Cells, Cultured
  • Chromosome Aberrations
  • Cricetinae
  • Cricetulus
  • DNA Damage*
  • Electricity*
  • Hypoxanthine Phosphoribosyltransferase / genetics
  • Mutation
  • Polymerase Chain Reaction
  • Sister Chromatid Exchange
  • Thioguanine / pharmacology

Substances

  • Hypoxanthine Phosphoribosyltransferase
  • Thioguanine