Electroreflectance spectroscopy of Si-GexSi1-x quantum-well structures
Phys Rev B Condens Matter
.
1986 May 15;33(10):6821-6830.
doi: 10.1103/physrevb.33.6821.
Authors
TP Pearsall
,
FH Pollak
,
JC Bean
,
R Hull
PMID:
9938007
DOI:
10.1103/physrevb.33.6821
No abstract available