Structural determination of crystalline silicon by extended energy-loss fine-structure spectroscopy
Phys Rev B Condens Matter
.
1989 Apr 15;39(12):8409-8422.
doi: 10.1103/physrevb.39.8409.
Authors
De Crescenzi M
,
L Lozzi
,
P Picozzi
,
S Santucci
,
M Benfatto
,
CR Natoli
PMID:
9947553
DOI:
10.1103/physrevb.39.8409
No abstract available