Thickness dependence of the dielectric susceptibility of ferroelectric thin films
Phys Rev B Condens Matter
.
1994 Nov 1;50(17):12375-12380.
doi: 10.1103/physrevb.50.12375.
Authors
WL Zhong
,
BD Qu
,
PL Zhang
,
YG Wang
PMID:
9975396
DOI:
10.1103/physrevb.50.12375
No abstract available