Interfacial roughness and related growth mechanisms in sputtered W/Si multilayers
Phys Rev B Condens Matter
.
1996 Aug 15;54(8):5860-5872.
doi: 10.1103/physrevb.54.5860.
Authors
T Salditt
,
D Lott
,
TH Metzger
,
J Peisl
,
G Vignaud
,
P Hoghoj
,
O Schärpf
,
P Hinze
,
R Lauer
PMID:
9986552
DOI:
10.1103/physrevb.54.5860
No abstract available