Auger and electron-energy-loss spectroscopy study of interface formation in the Ti-Si system
Phys Rev B Condens Matter
.
1990 Feb 15;41(5):3087-3096.
doi: 10.1103/physrevb.41.3087.
Authors
X Wallart
,
JP Nys
,
HS Zeng
,
G Dalmai
,
I Lefebvre I
,
M Lannoo
PMID:
9994082
DOI:
10.1103/physrevb.41.3087
No abstract available