Phillipp F - Search Results

1

Defect formation in self-assembling quantum dots of InGaAs on GaAs: a case study of direct measurements of local strain from HREM.

Jin-Phillipp NY, Phillipp F. Jin-Phillipp NY, et al. Among authors: phillipp f. J Microsc. 1999 Apr;194(1):161-170. doi: 10.1046/j.1365-2818.1999.00472.x. J Microsc. 1999. PMID: 10320550

2

On the accuracy of lattice-distortion analysis directly from high-resolution transmission electron micrographs.

DU K, Phillipp F. DU K, et al. Among authors: phillipp f. J Microsc. 2006 Jan;221(Pt 1):63-71. doi: 10.1111/j.1365-2818.2006.01536.x. J Microsc. 2006. PMID: 16438689

3

Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers.

Łaszcz A, Czerwinski A, Ratajczak J, Szerling A, Phillipp F, Van Aken PA, Katcki J. Łaszcz A, et al. Among authors: phillipp f. J Microsc. 2010 Mar;237(3):347-51. doi: 10.1111/j.1365-2818.2009.03258.x. J Microsc. 2010. PMID: 20500394

4

Nanoscale TiO island formation on the SrTiO3(001) surface studied by in situ high-resolution transmission electron microscopy.

Lee SB, Phillipp F, Sigle W, Rühle M. Lee SB, et al. Among authors: phillipp f. Ultramicroscopy. 2005 Aug;104(1):30-8. doi: 10.1016/j.ultramic.2005.02.005. Epub 2005 Mar 18. Ultramicroscopy. 2005. PMID: 15935914

5

Eleven nanometer alignment precision of a plasmonic nanoantenna with a self-assembled GaAs quantum dot.

Pfeiffer M, Lindfors K, Zhang H, Fenk B, Phillipp F, Atkinson P, Rastelli A, Schmidt OG, Giessen H, Lippitz M. Pfeiffer M, et al. Among authors: phillipp f. Nano Lett. 2014 Jan 8;14(1):197-201. doi: 10.1021/nl403730q. Epub 2013 Dec 19. Nano Lett. 2014. PMID: 24341867

6

Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications.

Ratajczak J, Łaszcz A, Czerwinski A, Katcki J, Phillipp F, Van Aken PA, Reckinger N, Dubois E. Ratajczak J, et al. Among authors: phillipp f. J Microsc. 2010 Mar;237(3):379-83. doi: 10.1111/j.1365-2818.2009.03264.x. J Microsc. 2010. PMID: 20500400

7

Direct atom-resolved imaging of oxides and their grain boundaries.

Zhang Z, Sigle W, Phillipp F, Rühle M. Zhang Z, et al. Among authors: phillipp f. Science. 2003 Oct 31;302(5646):846-9. doi: 10.1126/science.1089785. Science. 2003. PMID: 14593173

8

Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs.

Du K, von Hochmeister K, Phillipp F. Du K, et al. Among authors: phillipp f. Ultramicroscopy. 2007 Apr-May;107(4-5):281-92. doi: 10.1016/j.ultramic.2006.08.003. Epub 2006 Sep 7. Ultramicroscopy. 2007. PMID: 16996212

9

Real-time visualization of convective transportation of solid materials at nanoscale.

Wang Z, Gu L, Jeurgens LP, Phillipp F, Mittemeijer EJ. Wang Z, et al. Among authors: phillipp f. Nano Lett. 2012 Dec 12;12(12):6126-32. doi: 10.1021/nl303801u. Epub 2012 Nov 29. Nano Lett. 2012. PMID: 23194057

10

Metal-catalyzed growth of semiconductor nanostructures without solubility and diffusivity constraints.

Wang Z, Gu L, Phillipp F, Wang JY, Jeurgens LP, Mittemeijer EJ. Wang Z, et al. Among authors: phillipp f. Adv Mater. 2011 Feb 15;23(7):854-9. doi: 10.1002/adma.201002997. Epub 2010 Dec 27. Adv Mater. 2011. PMID: 21328479 No abstract available.

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